MIT and Brookhaven Lab scientists use electron microscopy imaging techniques to settle a solid-state controversy and raise new experimental possibilities
CFN’s Kim Kisslinger, seen here with a focused-ion beam instrument, reduced the InGaN samples to a thickness of just 20 nanometers to...Atomic-Scale Investigations Solve Key Puzzle of LED Efficiency MIT and Brookhaven Lab scientists use electron microscopy
No comments:
Post a Comment